ASTER adds "Design-to-Test" to their DfT SolutionsASTER have now added the capability to speed up the post layout test development process by generating the test files for assembly, X-Ray, optical inspection, flying-probe, in-circuit and boundary-scan machines such as MYDATA; Agilent i3070, Agilent 5DX; Teradyne GR228x, TestStation, Z1800 and Spectrum; Aeroflex; Takaya APT8000/APT9000; Acculogic; Asset; Goepel Electronics, JTAG Technologies and XJTAG.

ASTER Technologies, the leading supplier in Board-Level Testability and Test Coverage analysis tools, and ITOCHU, the leading technology provider for flying probe test systems announced today the forming of a strategic partnership that enables ITOCHU to supply their TAKAYA flying probe tester customers with ASTER’s TPQR for TAKAYA, the test coverage analysis tool.

During electronica 2008 at the New Munich Trade Fair Centre, ASTER Technologies the leading supplier in Board-Level Testability and Test Coverage analysis tools, introduces a new generation of “easy to use” test coverage analysis tools based on the powerful “TestWay” analysis tool, that will allow users to independently compute and analyze the coverage provided by a variety of testers used within the industry.