 | | Independent, Four-channel Support for Complete Control over Advanced JTAG Configurations. |
| Non-intrusive functional test solution for high performance ARM microprocessors. |
| Complete functional test solution for Athlon, Turion, and Opteron product families. |
| JTAG hardware platform that seamlessly integrates advanced boundary-scan test patterns into Teradyne in-circuit testers. |
| Corelis JTAG Embedded Test (JET) reduces test time, adds non-intrusive functional test. |
| CD Features IEEE-1149.6 Test Development Automation, Expanded Scripting. |
| New Version 1.21 Features Windows 64-Bit Operating Systems Support Including Windows 7 |
| Larger facilities provide for increased production, R&D, and product training. |
| Complete Boundary-Scan Product and Turn-Key Test Solution. |
| New Tool Offers Complete Structural and Functional Test Solutions for Reference Designs. |
| Corelis Boundary-Scan Tools Pinpoint Hard-to-Find Manufacturing Defects. |
| New Adapter Supports Intel XDP, XDP-Sinned, and ITP700Flex Connectors. |
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