"Automated Test" Product Guide

This page lists companies with one or more products emphasizing the keywords *Automated Test*. Click on any vendor to see a listing of related products. To see all products, click expand all.

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  • AcQ InduCom  (1)
    • M385 Universal Timer/Counter M-module
      The M385 is a programmable universal timer/counter M-module with tw (+)

      Features:

      • measurement channels. The frequency range is up t
      • 250MHz (M385/250M) or up t
      • 100MHz (M385/100M). The timer/counter is a register based device and can be programmed via a provided ANSI-C library. The analog input conditioning is software programmable with respect t
  • Advint LLC  (3)
    • System Integrator
      Advint is a leading system integrator of Commercial Off the Shelf (COTS) based test systems. Our solutions provide factory to field support for military and commercial electronics. (+)

      Features:

      • Custom test system design, integration, and fabrication (PXI, VXI, LXI, SCXI, GPIB) – Turnkey COTS test systems – Rugged portable testers – Functional and in-circuit test in one system – Field calibration – National Instruments and Teradyne alliance partner
      • Software – Test requirements analysis and test strategy definition – Test program development (LabWindows/CVI, LabVIEW, TestStand, ATLAS, Visual Basic, etc.) – Automated test program translation of legacy code to modern programming languages – Instrument drivers (IVI, VISA, etc.) – GUIs – ATML/XML test description and test results – SQL database interface/storage applications
      • Hardware interface – Custom test interface designs – Complete test adapter manufacturing services – Discrete wire and PCB based interface adapters – Cabling and wire harnesses – Circuit cards – Test assemblies
    • System Integrator
      Factory to field support for military and commercial electronics (+)

      Features:

      • Custom test system design, integration, and fabrication (PXI, VXI, LXI, SCXI, GPIB)
      • Turnkey COTS test systems
      • Rugged portable testers
    • Puma Ruggedized Portable Test System
      Ruggedized, portable, and field deployable (+)

      Features:

      21475.jpg
      • Small size and weight facilitates compact packaging in rugged enclosures to support mobile operations with a reduced logistics footprint
      • 18-slot PXI and 4-slot SCXI chassis containing wide variety of digital, analog, electro-optics, RF, and switch instrumentation for functional testing of modern electronics and avionics
      • System provides power distribution, Unit Under Test (UUT) power supplies, system cooling, and UUT isolation
  • ALFAUTOMAZIONE Srl  (2)
    • SmartPXI WL1000
      PXI multi-port vector signal analyzer and vector signal generator for test of WLAN (802.11a/b/g/n) and WiMAX(802.16-2004/2005), scalable platform. (+)

      Features:

      • Application areas are: WiFi, RF test for 802.11a/b/g devices MIMO, RF test for 802.11n devices WiMAX, RF test for 802.16-2004/2005 devices
      • Transmitter Test (Output power, power rise/fall, spectral flatness, constellation error…) Transceiver Test Receiver Test (Sensitivity, adjacent/alternate channel rejection, receiver linearity…)
      • Up to 4 Vector Signal Analyzer and 4 Vector Signal Generator Synchronized to a common reference.
  • Amfax Ltd  (1)
    • N/A
      Photonic Test and Measurement Solutions (+)

      Features:

      • developing many functional test solutions for packages and components manufacturers in Europe, Canada and North America
      • Specialized in Fully Automated Functional Test Solutions for Laser Diode test at Bar, Die, and Chip on Carrier level
      • Automated pick and place via SCARA type robots, with an integrated vision system, from Waffle, Gel, Auer boat etc. provides fast, accurate pick & place, and most importantly, ZERO product damage
  • Astronics  (1)
    • CTS-6000 Series
      Astronics Test Systems introduces a breakthrough radio test solution for use in commercial aerospace, military, and civil security applications. The new CTS 6000 Series radio test set incorporates nine test capabilities into a single tester with an easy-to-use, modern touchscreen interface for testing radio communications systems at the factory, at the depot or in the field. It provides extensive test capability for any radio system to reduce testing time and cost, maintenance and calibration costs, lifecycle ownership costs, and the number of “no fault found� results. (+)

      Features:

      337763743622101864.jpg
      • Includes RF signal generator, analyzers, power meter, and receiver
      • Includes AF signal generator, audio meters, oscilloscope, reference oscillator and tracking generator
      • Tablet-based, intuitive design with sunlight readable display
  • Astronics Test Systems  (1)
    • Astronics Test Systems (ATS)
      Astronics Test Systems (ATS), headquartered in Irvine, CA, is an established leader in the design and production of test systems for a multitude of electronic applications. With more than 50 years in the test and measurement business, ATS is vertically integrated, with an ability to design and deliver the right test in the right place, at the right cost. (+)

      Features:

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      • Test from silicon to finished IoT products
      • Electrical, Thermal, and Mechanical Test
      • Custom test solution design services
  • B & B Technologies, Inc.  (3)
    • N/A
      B & B Technologies, Inc. Services: Requirements Analysis, Driver Software Development, Application Software Development, System Design, System Integration, System Installation, Instrumentation Design, Instrument Prototyping and Test, Circuit Design, DSP Design, Training (+)

      Features:

      • Experience with the following operating systems, languages and standards: Windows (3.1, 95, 98, NT), DOS, Macintosh, UNIX, LabVIEW, LabWindows CVI, C, GPIB, serial interfaces, CAMAC, VXI, VME, PXI, ISA bus, PCI bus, 1553 bus and TCP/IP
      • Extensive experience with data authentication and encryption
      • General application areas of expertise include the following: Automated Test Equipment, Data Acquisition, Driver Software, Environmental Monitoring, Image Processing, Industrial Automation, Instrument Control, Medical Laser Instrumentation, Motion Control/Robotics, Remote Monitoring and Control, RF/Microwave, Signal Conditioning, Test and Measurment, Training [...]
    • IVDAS
      A mobile data acquisition system for in-vehicle testing (+)

      Features:

      • Can accomodate any mobile in-vehicle test
      • Modular, expandable COTS hardware
      • Meets specific vehicle proving-ground test needs
    • DSAS 2010
      An automated high speed and high channel count dynamic signal acquisition recorder test system (+)

      Features:

      • Capable of acquiring and displaying run-time data while digitally storing up to 96 channels of 24-bit vibration data at scan rates of up to 102.4 kHz per channel
      • Every channel on every card is simultaneously triggered and synchronized to the same scan clock in order to provide data suitable for high-resolution phase analysis, with a 120 dB dynamic range and a 45 kHz alias-free bandwidth
      • Each channel has the option of software configurable ICP conditioning
  • Cal-Bay Systems, Inc.  (1)
    • N/A
      Cal-Bay Systems is a Value-Added Provider for the test, measurement, and automation industry (+)

      Features:

      • Combines knowledge of hardware and software tools with expertise in a wide range of industries to provide customers with working solutions for their test and automation needs
      • Areas of expertise: Automated Test, Industrial Automation, Embedded Control, Instrument Interface
      • Services provided: Project Specification, System Design and Layout, Component Specification and Procurement, Software Development, Mechatronic Integration, Documentation, Installation, Training, and Support [...]
  • California Instruments  (1)
    • MX Series
      Programmable AC and DC power supply/analyzer for frequency conversion and product test applications (+)

      Features:

      • Available output power of 45KVA per unit and multi-unit configurations for power requirements up 135KVA
      • Single and three-phase mode programming
      • Arbitrary waveform generation
  • Consultronics  (8)
    • Auto-TIMS IIIR
      A rackmount dataline analyzer (+)

      Features:

      11306.jpg
      • Can be applied as a stand-alone solution or as part of a test system for qualifying 2 and 4-wire circuits
      • Control of the unit is made through either RS-232 or IEEE-488 interfaces
      • National Instruments LabView drivers available for automated test solutions using both interfaces [...]
    • Auto-TIMS III
      An automatic data line analyzer that can test the quality of a 2- or 4-wire voice circuit, data circuits, or xDSL local loops in less than 2 minutes (+)

      Features:

      10776.jpg
      • Manual mode for adjusting data levels and making individual measurements
      • Graphic display for easy interpretation of results
      • Can store and print test results
    • CoLT-450
      DSL service verification test set (+)

      Features:

      11304.jpg
      • Hand-held
      • LCD display
      • Rapid change modem module(s)
    • NQMSplus
      An open and highly scalable platform for Quality of Service (QoS) testing, performance monitoring, and alarm management applications (+)

      Features:

      • Supports a varied range of test heads for PSTN, ISDN, etc., for intrusive and non-intrusive testing
      • Includes sophisticated administrative and scheduling functions, user-configurable network maps, reports and graphs, multilingual support, and TMN interfaces [...]
    • NQMSlite
      An inexpensive, entry-level, distributed Quality of Service (QoS) test system for private or public telephone networks as well as VoIP services (+)

      Features:

      • Automatic end-to-end measurements of call establishment and call quality parameters can be scheduled from one or more central locations
      • Provides essential information, reports, and statistics about the health of the monitored network over time
      • Overlays onto existing telephony networks
    • CoLT-250
      An test set for verifying that ADSL service can be properly delivered from the central office to the subscriber, and that local loop can carry the promised service (+)

      Features:

      10772.jpg
      • Lightweight, handheld design
      • Runs a test at the push of a button
      • Attaches directly to the copper pair via telco clips
    • CableSHARK
      An xDSL cable qualifier designed to fully analyze the copper loop at the physical layer (+)

      Features:

      10773.jpg
      • Tests include frequency response testing to 2 MHz, automatic and manual time domain reflectometry, power spectral density noise testing, patent-pending DMT test, and longitudinal balance
      • Users can bridge onto live circuits with the spectral detective to verify compliance to transmit level limits in unbundled and line sharing environments
      • Graphic power spectral density measurements
    • CableSHARK RM
      xDSL cable qualification for unbundled loop environments (+)

      Features:

      11305.jpg
      • 19-inch rackmount configuration
      • Controlled remotely via an RS-232C interface
      • Tests include frequency response testing to 2 MHz, automatic and manual time domain reflectometry, power spectral density noise testing, patent-pending DMT test, and longitudinal balance
  • DiagnoSYS Limited  (2)
    • PinPoint II PXI
      The PinPoint is a versatile, scalable system that provides you with the ability to diagnose and maintain electronic circuits ensuring your mission critical systems stay operational (+)

      Features:

      34866.jpg
      • Embedded PXI Card Chassis allows you to customize your PinPoint to target your specific test goals
      • Test individual components in-circuit using fixtureless clip techniques or at the card edge or a bed of nails fixture
      • Advanced digital and V/I testing to prevent damage to sensitive components
    • FaultFinder PCI
      FaultFinder PCI turns your PC into an effective PCB fault finding system (+)

      Features:

      34865.jpg
      • A comprehensive AutoLearn process helps generate test programs in minutes
      • Fully automatic guided probe - onscreen instructions lead you to each test point in the desired order
      • Impedance Signature Analysis (SA) and digitally synthesized waveforms as part of the base system
  • EADS North America Defense  (10)
    • 1260-82C/D/F
      1 x 2 optical switch modules for dual-source or dual-receiver selection in automated test systems (+)

      Features:

      • Supplied with VXI Plug & Play install disks for Windows 95 and WindowsNT frameworks [...]
    • 1260-22
      40-channel, SPST high power switch module designed for switching and routing high current sources such as AC and DC power supplies in an automated test system (+)

      Features:

      • Internal jumper locations on the module facilitate 1x2 and/or 1x4 configurations; internal component locations are available on every channel for the installation of surge suppresers and/or filters
      • A fail-safe reset line on the front panel automatically opens all relays if an unsafe condition occurs
      • All modules can be controlled as a complete switch system by a single Option 01 message-based daughter board or the Option 01T register-based and message-based daughter board
    • Engine Test System
      An integrated instrumentation suite that provides diverse solutions that meet the demands of the engine test community (+)

      Features:

      • Flexibility to test multiple engine types
      • Jet engine test system solution uses common hardware and test program sets for both land- and sea-based installations
      • Capable of testing the F414, F404, F110, F405, F402, and J52 jet engines as well as two auxiliary power units
    • 6351
      Provides 96 bidirectional channels along with a digital probe unit (+)

      Features:

      • All electronics are incorporated within the module, eliminating external interface pods that may be hard to integrate
      • Signal fidelity is maintained because, for each channel, signal and return lines are brought to the UUT
      • The algorithmic operation of the card offers a high level of flexibility to the user
    • 8800
      An optical attenuator module (+)

      Features:

      • Modules can quickly and easily be removed and replaced
      • Ideal for SONET test, fiber-optic component test, and fiber network monitoring
      • Linear absorbing glass prism achieves precise attenuation of optical channels
    • ButterflyNet
      A test fixture for life-test, burn-in, and characterization of laser diode and other butterfly-packaged photonic devices (+)

      Features:

      • 16-device capacity
      • Bolt-free design for easy insertion and removal of up to 16 devices
      • Provides a repeatable, uniform thermal contact between the fixture and the device package for heat transfer
    • N/A
      Freedom Series allows customization of ATE test stands for unique production and service requirements at commercial-off-the-shelf prices (+)

      Features:

      • Freedom Series offers a choice of instruments and components (VXIbus and IEEE-STD-488) that meet test requirements from a range of vendors, eliminating costly non-recurring engineering charges
      • If your requirements fall outside the scope of Freedom, Racal Instruments' custom integration team can design the Freedom Series' components to meet specific requirements balanced by budgetary constraints [...]
    • 1257
      A subsystem for RF, microwave, and optical switching (+)

      Features:

      • Capacity of up to 240 channels
      • Standard GPIB and RS-232 remote interfaces
      • 4U, 5U, or 6U 19” rackmount chassis
    • Freedom Series
      Freedom Series eliminates non-recurring engineering costs in custom-designed automatic test equipment (ATE) systems (+)

      Features:

      • Each component of an integrated ATE system is configured with computer software, then assembled, diagnosed and delivered using manufacturing techniques with no system engineering costs
      • The Freedom Series takes the modularity of the VXIbus to the system level
      • All components of custom integrated integrated ATE system, including cables, racks, slides, mounting requirements, address settings, station interfacing and system configuration, are compiled and documented by the automatic engineering software
    • 6401 Release 5 Layer 1 Test System
      Designed for UE product development and integration testing (+)

      Features:

      • Supports HSDPA
      • DSP functional and performance testing
      • Non-DSP sub-system performance testing
  • Emulation Technology, Inc.  (2)
    • QUAD-4 Clip
      A probe designed to clip over surface-mounted DDR SDRAM memories in the TSOPII package style, in pin counts of 50, 54, 66, and 86, and lead pitches of 0.800 mm to 0.50 mm (+)

      Features:

      • Spring probe (pogo pin) design ensures mechanically accurate, non-invasive contact with TSOPII package leads
      • Enables access to individual or multiple signals when used with a logic analyzer, oscilloscope, or other test equipment
      • Suitable for development, debugging (hand test), program, and test (qualification and production) devices [...]
    • ET MicroClip
      Specially designed for providing new or additional test points on existing printed circuit boards (+)

      Features:

      • Attaches onto passive surface-mount 0201, 0402, 0603, or 0805 components
      • Allows system probing even if test points or break-out pins are unavailable
      • Allows hands-free probing of surface-mount components
  • ESO Technologies  (2)
    • ATCA-Tester
      Automated software tool testing AdvancedTCA equipment compatibility with respect to PICMG 3.0 specification system management requirements (+)

      Features:

      21323.jpg
      • 72 test scenarios in 1.2.0 version based on PICMG 3.0 / IPMI 1.5 specifications and on AdvancedTCA interoperability workshops test scenarios
      • Test categories (depending on test target) include RMCP network, IPMC, FRU based (AdvancedMC ready), Sensors, Chassis, Shelf manager
      • Simultaneous test of several IPMC/FRUs in parallel possible
    • HPI-Exerciser
      An advanced software tool used to test HPI implementation (functional & stress testing), to test application above HPI and to check HA global platform behavior (middleware + application + hardware) (+)

      Features:

      21359.jpg
      • Investigation tool getting access to HPI information for functional and stress testing
      • Analysing platform behavior in response to simulated errors without modification of customer applications or high availability middleware
      • Facilitate Application/System integration and validation by testing via HPI
  • ETEC (The Sensor Test Company)  (8)
    • Accelerometer Test
      Family of automated test systems for airbag silicon accelerometers (+)

      Features:

      • Offers optimized test solution for variable temperature and vibration testing
      • Controls multiple vibration systems and communicates with device handlers to coordinate device indexing
      • Instrumentation conforms to VXIbus and IEEE-488.2 standards [...]
    • Accelerometer Testing
      Family of automated test systems for airbag silicon accelerometers (+)

      Features:

      • Offers optimized test solution for variable temperature and vibration testing
      • Controls multiple vibration systems and communicates with device handlers to coordinate device indexing
      • Instrumentation conforms to VXIbus and IEEE-488.2 standards [...]
    • DSRM
      A test module for multi-wire serial communication busses (+)

      Features:

      • Command sequencer based operation
      • Instruction set tailored to functional test of MEMS devices
      • Integrated counter
    • MEMS gyro production test system
      High volume VXI-based MEMS gyro calibration and test system for multi-axis MEMS gyros (+)

      Features:

      • based on ETEC's M/STeP MEMS/Sensor test platform
      • increased use of MEMS rate and acceleration sensors
      • for automotive and commercial applications
    • STeP
      Sensor test platform designed to quickly test micromachined sensor technologies (+)

      Features:

      • Performance advantages include: tools for reducing cost of test and time to market, common solutions for engineering/production/QA, migration path, subsystem customization, client-server application, and remote access [...]
    • N/A
      Our expertise in VXI sensor testing has allowed us to significantly strengthen and expand our sensor technology capabilities (+)

      Features:

      • We have invested money and time to fully explore the micromachined sensor technologies and are proud to offer test systems covering accelerometer sensor testing and pressure system testing at the package or wafer level [...]
    • PST
      Pressure sensor test (PST) system designed to lower the cost of tests by providing a dynamically controlled ambient atmosphere with versatile fixturing to accommodate proprietary package types (+)

      Features:

      • Pressure and temperature control, device handling options, custom modular device fixtures, turnkey application development, graphical user interface and data log tools [...]
    • N/A
      Provides sensor technology VXI test system design, manufacturing and integration to worldwide automotive suppliers and sensor manufacturers (+)

      Features:

      • Accomplishments include the establishment of industry standards for accelerometers testing, developed and integrated a new system software/hardware called STeP, and added pressure sensor wafer testing to meet the demands to save cost in high volume production [...]
  • Flextronics  (6)
    • N/A
      Offers over 26 years of experience in the ATE industry, maintaining a technical edge in systems integration and digital electronics, using state-of-the-art graphical programming languages such as LabVIEW and LabWindows with VXI test systems technology (+)

      Features:

      • IE has successfully provided customized test and measurement solutions for commercial and military customers spanning a wide range of industries
      • IE provides test systems solutions at reasonable pricing, engineering services by a seasoned engineering staff, training, complete hardware and software documentation including source code, installation, and worldwide onsite support [...]
    • VXI-390 Series
      Commercial-off-the-shelf reconfigurable (CORE) functional ATE test system (+)

      Features:

      • Uses industry-standard instruments and peripheral interfaces
      • Applies digital, analog, and RF/microwave instrumentation to the unit under test (UUT)
      • Users can expand the VXI-390 and reconfigure it by changing instrument driver virtual instruments (VIs) and hardware
    • VXI-390, Model 2010
      COTS, LabVIEW-based, high-performance functional digital and mixed-signal hybrid automatic test system (+)

      Features:

      • Designed with a 50 MHz data rate and 256 VXI digital pin I/O channels (expandable to 1152 pins)
      • Requires NO-NRE and is designed to meet general-purpose and specific automatic test applications [...]
    • VXI-390, Model 2262
      Test system consisting of a 133 MHz Pentium PC with monitor, interfacing to power supply system and 512-pin load assembly via MXI (+)

      Features:

      • a 50 MHz, 128-pin bidirectional voltage programmable VXI digital test subsystem, a 250 MHz arbitrary waveform generator, and a 6 1/2 digit DMM
      • Expandable: digital and analog pins can be doubled [...]
    • VXI-390, Model 2260
      Contains two chassis of VXI and VME instruments; seven GPIB boxes connected to an external PC controller; avionics bus modules (+)

      Features:

      • Controlled by LABwindows/CVI running on external Pentium PC
      • Avionics test modules combine in 13-slot VXI chassis with VXI format D/A converter, RVDT simulator, static digital I/O and custom charge generator cards [...]
    • VXI-390, Model 2263
      Static failure mode analysis (FMA) test system with Pentium controller, DMM, transistor curve tracer, power supply and cross point matrix switching system (+)

      Features:

      • Configured with 256 channels, expandable up to 640 channels with VXI cage and 1280 channels in a single console
      • Switching flexibility between diagnostic devices and leads [...]
  • FuturePlus Systems Corporation  (3)
    • FS3011 PMC Probe
      Offered by Future Plus (+)

      Features:

      • This PMC bus protocol analysis probe and extender plugs into a PMC target system to capture and display protocol transactions on a logic analyzer
      • 32 or 64 bit supported at up to 66 MHz clock frequency
      • PMC bus protocol decode software executes in your Agilent logic analyzer
    • FS3100
      Offered by Future Plus (+)

      Features:

      • Provides an electrical and mechanical interface from a VMEbus backplane to HP logic analyzers for passive analysis
      • Test points allow measurement of the power and signal fidelity of the bus under test
      • Software executing on the HP logic analyzer decodes the key VMEbus signals and presents a readable display [...]
    • FS4410
      Offered by Future Plus (+)

      Features:

      31469.jpg
      • FS4410 Serial RapidIO (SRIO) protocol analysis probe
      • Nonintrusive probing a SRIO bus at a serial data rate of up to 3.125 Gbps
      • Connects to the system under test with various probe adapters and monitors bus traffic in real time
  • Geotest  (13)
    • GX7500
      Universal interface receiver for GX7000 PXI Chassis (+)

      Features:

      21429.jpg
      • Mass interconnect for any test and data acquisition application
      • Modular design with multi-vendor support
      • Standard and custom configurations
    • GX6062
      A high-density RF multiplexer in 6U PXI form factor (+)

      Features:

      15787.jpg
      • 12 groups of 1:4 multiplexers that can be software controlled to provide various multiplexer configurations, while maintaining the instrument's full 200MHz of bandwidth
      • Provides differential RF switching and may be configured as 12 x 1:4, 6 x 1:9, 2 x 1:29, 1 x 1:59, as well as other configurations
      • Suited for Automated Test Equipment (ATE), parametric measurements, engineering verification, high-density switching systems, and RF communications [...]
    • ATEasy Software
      A test executive and offers a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems (+)

      Features:

      • Provides all the necessary tools to develop and maintain software components, from instrument drivers to complex test programs
      • Test applications are faster to generate and easier to maintain
      • Includes a complete test development suite, which is specifically designed for test applications
    • ATEasy 5.0 Software
      32-bit, object-oriented programming framework (+)

      Features:

      19890.jpg
      • Instrumentation/test-system-like modular structure
      • Rapid Application Development (RAD) environment
      • Built-in test executive and profile editor
    • DIOEasy
      A 32-bit graphical development environment for digital test vectors (+)

      Features:

      • Supports Geotest's family of digital test products and enables users to create digital test vectors up to 128 Mbits deep and up to 512 pins wide
      • Allows users to create vectors or import the vectors from other applications
      • Control and logic state editor supports algorithmic sequencing and provides for automatic generation of vector data [...]
    • GX5920
      The GX5920 100 MHz frequency multiplier module increased the upper test rate limit of the GX5x50 family to 100 MHz (+)

      Features:

      • The increase in test rate is achieved by interleaving a single I/O pin into two parallel memory locations
      • Provides 16 input or output pins (in groups of 8)
      • It is a plug-in unit for the GX5050, GX5150, and GX5250 high-speed digital I/O products
    • GX6264
      A high-density 6U PXI switching board with 128 single-ended, or 64 differential switching channels (+)

      Features:

      7810.jpg
      • With multiple buses, it is ideal for ATE and other test applications where UUT signals must be switched to several test instruments
      • Available in commercial grade and industrial grade configurations
      • 250 VDC maximum switchable voltage
    • GX5641 - BI-DIRECTIONAL DIFFERENTIAL-TTL I/O
      Used for general data acquisition, process control, automatic test equipment and functional test, and factory automation (+)

      Features:

      • Consists of 64 Bi-Directional TTL-Differential channels and supports 128 individual digital inputs or outputs
      • Channels can be predefined to convert TTL to Differential and vice versa [...]
    • MTS-206
      A rugged, portable tester for the Maverick Missile System (+)

      Features:

      15806.jpg
      • Field testing of the AGM-65 missile, missile sections, LAU-117 & LAU-88 launchers, and launcher-missile clusters
      • PXI architecture
      • Full parametric test with optional diagnostics
    • MTS-206
      A rugged, portable tester for the Maverick Missile System (+)

      Features:

      • Field testing of the AGM-65 missile, missile sections, LAU-117 & LAU-88 launchers, and launcher-missile clusters
      • PXI architecture
      • Full parametric test with optional diagnostics
    • GX5150
      A high-speed, 6U PXI instrument with 32 bits of I/O channels that support test rates of up to 100 MHz and vector depth of up to 128 Mbits/pin (+)

      Features:

      7807.jpg
      • Includes a sequencer with conditional jump and pause commands
      • Multiple I/O level configurations including TTL, ECL, and PECL
      • Optional real-time comparison to memory or to a known good board
    • MTS 207 Rugged Field Test Set
      Ultra-rugged and portable PXI platform for field and flight-line applications (+)

      Features:

      21064.jpg
      • Meets MIL-STD-810E requirements for harsh environmental conditions
      • Built-in, shock-mounted, 14-slot PXI chassis (seven 3U and seven 6U slots)
      • A wide range of PXI modules available to tackle any test or data acquisition application
    • MTS-207 Test Set
      State-of-the-art, portable PXI platform for field testing and data acquisition systems (+)

      Features:

      • Its architecture is based on the MTS-206, which has been qualified as a flight-line tester for the Maverick Missile system
      • Combines the capabilities of the versatile and powerful PXI architecture in a compact, ultra-rugged, flight-line qualified enclosure
      • Ideal for test and data acquisition applications requiring operation under harsh environmental conditions
  • GOEPEL electronic  (15 of 18)
    • SYSTEM CASCON
      SYSTEM CASCON comprises the CASCON GALAXY and CASCON POLARIS software suites and works with the award-winning Boundary Scan hardware platform SCANFLEX (+)

      Features:

      34436.jpg
      • Tight integration of all software tools within one software application streamlines the test development process
      • JTAG/Boundary Scan software suite for test and in-system programming for FLASH, PLD/FPGA and serial EEPROM at board level and in system environments (such as AdvancedTCA)
      • Fully IEEE 1149.x compliant (JTAG/Boundary Scan per IEEE 1149.1, 1149.4, 1149.6
    • PXI 4011 Simulation card 4 encoder interface
      PXI 4011 for the single-ended incremental encoder simulation had been developed for a special customer requirement and is now being offered as a single PXI solution (+)

      Features:

      • It has four channels and three tracks per channel
      • The user part is galvanically isolated from the PXI part (therefore not grounded)
      • Tracks A, B and zero as 30 V signal single-ended
    • PXI 3240 Comparator
      PXI 3240 is a comparator module with 16 input channels (+)

      Features:

      • Especially suited for signal monitoring applications
      • The card records and evaluates analog signals and outputs a Pass/Fail message (2 levels per channel) PXI 3240 can be operated in a CompactPCI or a PXI system
      • 16 input channels
    • PXI 3013 Digital OUtput
      With this card, digital output signals up to 30 V can be generated (+)

      Features:

      • 32 digital outputs
      • Max. reference voltage 30 VDC
      • 5..30 VDC input voltage
    • PXI 4010
      Input Signal Simulator (+)

      Features:

      • PXI 4010 provides an interface for the simulation of incremental input signals
      • Generates a signal for trace A, a signal for trace B and a zero-trace signal
      • SSI input signal can be simulated
    • Leaflets BScan integration into ATE systems
      Leaflets about the integration of Boundary Scan technology into ATE systems such as In-Circuit-Tester (ICT) and Flying Probe Tester (FPT) (+)

      Features:

      • Discuss solutions for the combination of JTAG/Boundary Scan with Flying Prober Testers (SPEA 4040, Scorpion Flying Scorpion, and Digitaltest MTS 500 Condor) as well as In-Circuit Test systems (Teradyne Spectrum 88xx, Digitaltest MTS 30, MTS 180, MTS 300, and MTS 888, and Agilent 3070)
      • In the individual brochures, proposed solutions for the combination of In-Circuit Test or Flying Probe Test, respectively, with JTAG/Boundary Scan are outlined
      • Each ATE system has its specific benefits which are complemented by integrating advanced JTAG/Boundary Scan capabilities
    • PXI 3116 16 Power Relays
      PXI 3116 allows the switching of 16 separate electric signals (+)

      Features:

      • Each relay is connected to the plug connector by 3 pins
      • Max. switching current (DC) per relay: 5 A at 30 V (DC)
      • Max. switching current (AC) per relay: 2 A at 230 V (AC)
    • PXI 4008-8
      8 Channel resistance simulator (+)

      Features:

      • PXI 4008 is equipped with 8 channels to simulate resistances
      • Each channel can be connected to 2 different potentials, and each channel can generate 4 resistances
      • The resistances are interconnected via relays, i.e. they are connected potential-free
    • VarioTAP
      VarioTAP is a revolutionary technology for pattern streaming on TAP (Test Access Port) signals compliant with IEEE Std. 1149.1 (+)

      Features:

      • Boundary Scan test operations executes in conjunction with Emulation tests (Interlaced JTAG/Boundary Scan)
      • High-speed On-Chip Flash Programming
      • Ultra fast programming of FLASH devices external to the µP
    • Combination AOI/Boundary Scan
      combined system consists of Boundary Scan software and hardware integrated into their OptiCon AdvancedLine and SpeedLine in-line AOI systems (+)

      Features:

      17081.jpg
      • A universal contactor connects power supplies and the JTAG bus to the unit under test (UUT) in an in-line process
      • Test coverage is extended by a special test probe mounted on the camera for checking Boundary Scan IC pins which do not have any connections to other Boundary Scan pins (e.g. BGA pins which are wired directly to a connector)
      • A fully programmable power supply monitors the UUT's power consumption during testing
    • TESSY Functional Test System
      Modularly configurable functional test system meeting the specific requirements for vehicle control unit tests (+)

      Features:

      • The system is equipped with vehicle-type and manufacturer-specific configurable communication interfaces (CAN and diagnosis)
      • Time-critical protocols are controlled by microcontroller-based modules on PXI basis
      • Modular hardware structure for easy adaptation to the unit under test (UUT)
    • PXI 5348 Boundary Scan Differential I/O
      Operation in PXI and CompactPCI racks (+)

      Features:

      20588.jpg
      • 48 differential test channels
      • PXI increment supports the following differential standards: VDS, BLVDS, LVPECL
      • Each channel is input, output or bi-directional depending on I/O standard
    • OptiCon BasicLine
      The stand-alone system OptiCon BasicLine 1M/4M from GÖPEL electronic is based on the recently introduced new AOI hardware platform and enables a high fault coverage as well as a flexible and efficient usage in the production process. The centre piece of the new family is a modularly extendable camera. This new camera concept allows alternative selection between a one and four mega-pixel camera module. For an even higher test coverage users will be able to add additional camera options for THT components, colour inspection or 3D measurement as well as angled view inspection for the inspection of J-Lead pins at PLCC and SOJ components. The new platform is designed with performance in mind offering higher test speed, reduced debug times, minimal false call rate and extremely high fault coverage. (+)

      Features:

      • enables high fault coverage and test speed
      • features a a modularly extendable camera which allows alternative selection between a one and four mega-pixel camera module
      • additional camera options for THT components, colour inspection or 3D measurement as well as angled view inspection for the inspection of J-Lead pins at PLCC and SOJ components
    • SCANFLEX for PXI
      With innovative Boundary Scan Power Supplies, Digital I/O, Differential I/O, and Mixed Signal I/O PXI modules, GOEPEL Electronics offers a complete range of PXI products for the integration in respective ATE systems to support Extended Boundary Scan operations in combination with various other test and programming methodologies (+)

      Features:

      33781.jpg
      • SCANFLEX excels when it comes to speed, flexibility, and modularity of a Boundary Scan test system [...]
    • SFX 1149.4
      This new member of the SCANFLEX I/O module family is called SFX1149.4 and provides resources for the test of analog circuits based on the IEEE Std. 1149.4. This new SCANFLEX module is another milestone on GOEPEL electronic's path to provide its customers tools for extended Boundary Scan tests based on a scaleable system architecture. (+)

      Features:

      • SFX1149.4 module provides one complete dot4 test bus (AT1, AT2) and can be plugged directly onto a SCANFLEX TAP transceiver (SFX-Transceiver)
      • For the support applications with multiple dot4 test busses, several SFX1149.4 modules can be integrated in a SCANFLEX® module carrier (SFX-Carrier)
      • The module provides a variety of advanced functions for R, L, and C measurements and the generation and measurement of AC and DC signals with wide-range programmability in voltage, current, and frequency
  • Interface Technology, Inc  (10)
    • CTF-1000
      A component test fixture that provides a convenient way to connect a variety of instrumentation to conventionally packaged semiconductor devices (+)

      Features:

      • Primarily intended for use with the Interface Technology SM15 Source Measure Module
      • Can also be used with a variety of other instrumentation, including Source Measure Units, voltage, and current sources, DMMs, LCR meters, oscilloscopes, electrometers, etc.
      • Four component sockets simplify connections to a variety of devices
    • VisTE
      The VisTE Visual Test Editor software provides users of the Interface Technology SR5000 and SR5500 with a simple environment for quickly developing digital test programs (+)

      Features:

      • Test programs are partitioned into projects, which are developed off-line
      • Features such as Cut/Copy/Paste simplify test pattern editing and make test development more productive [...]
    • SR5000 Series
      DC to 50 MHz Data Rates (+)

      Features:

      • Stimulus / Response / Real-Time Compare
      • Expandable to 640 Inputs and 640 Outputs
      • RAM-Backed and Algorithmic Pattern Generation
    • WaveEdit
      Graphical waveform display/editor plug-in module for the SR5000 and SR2500 Test Development Software (+)

      Features:

      • Software includes soft panel for interactive setup and control of test programs, timing parameters, field definitions, test vectors, sequence and record control, and display of recorded data
      • Graphical features include waveform pattern editing, timing editing, and display of recorded data [...]
    • SR5510
      1M deep 50 MHz digital stimulus/response timing/control module provides high-performance digital test capability in the VXI format (+)

      Features:

      • Provides system timing, test sequence control and record control functions for the SR5540 I/O modules
      • LabWindows, LabWindows CVI, LabVIEW and VXIplug&play drivers available [...]
    • LP5000
      LASAR post processor and runtime software package enables users to port test vectors, fault dictionary and guided probe data to Interface Technology's line of VXI test subsystems, including SR5000, SR5500 and SR2500 (+)

      Features:

      • Available individually and in packaged configurations
      • Supplied with WIN Framework VXIplug&play interface [...]
    • SM25
      A dual-channel source-measure instrument for the VXI test environment (+)

      Features:

      10585.jpg
      • Single-slot VXI C-size module
      • Can make single-point measurements in 1msec simultaneously on both channels
      • Performs simple pass/fail tests in under 1msec
    • SR2500-008
      Allows users to define stimulus and response test patterns using waveform graphics (+)

      Features:

      • WaveEdit is distributed as an extension to the SR5000 and SR2500 WIN framework plug & play soft panel, so test developers still have access to all of the setup and control features of the WIN soft panel including the ability to save and load tests from file and enter patterns in a numerical format [...]
    • SR2500GP
      VXI digital test subsystem consisting of two dual-slot C-size VXIbus modules, an SR2510 main module and an SR2520 expansion module (+)

      Features:

      • Supports both parallel and serial testing of all standard TTL, differential ECL, variable voltage, or 5V CMOS logic devices, assemblies, units, or systems that require up to 576 individual input and output channels
      • Self-contained stimulus/response/real-time compare/record digital test module providing up to 96 bidirectional input/output channels
      • Each module provides 32-96 additional bidirectional I/O channels, up to a maximum of 576 channels per VXI mainframe [...]
    • SR2500
      VXI digital test subsystem consisting of two dual-slot C-size VXIbus modules, an SR2510 main module and an SR2520 expansion module (+)

      Features:

      • Supports both parallel and serial testing of all standard TTL, differential ECL, variable voltage, or 5V CMOS logic devices, assemblies, units, or systems that require up to 576 individual input and output channels
      • Self-contained stimulus/response/real-time compare/record digital test module providing up to 96 bidirectional input/output channels
      • Each module provides 32-96 additional bidirectional I/O channels, up to a maximum of 576 channels per VXI mainframe [...]
  • Invisar, Inc.  (2)
  • National Instruments  (8)
    • PXIe-8108
      High-performance embedded controller, which features an Intel Core 2 Duo T9400 processor and is designed to significantly reduce test times for PXI Express - and CompactPCI Express-based automated test systems (+)

      Features:

      42408.jpg
      • Engineers can use this 3U embedded controller in any PXI Express chassis to create a compact, high-performance PC-based platform for many test, measurement and control applications
      • With its 2.53 GHz dual-core processor, 800 MHz DDR2 memory and 1 GBps total system bandwidth, the NI PXIe-8108 is ideal for advanced RF and wireless test applications, high-throughput data acquisition systems and other applications that require intensive analysis, signal or image processing
      • NI PXIe-8108 optimizes RF and wireless test applications because measurement speed is related to the computational performance of the test system's controller
    • LABWindows for DOS
      DOS-based software development system for test and measurement applications (+)

      Features:

      • Combines standard programing languages with libraries of functions to provide a development environment with code generation and debugging utilities; a library of instrument drivers for GPIB, VXIbus, and RS232 instruments; a library of routines that are useful for building new VXIbus device drivers; an optional advanced analysis library, that includes digital signal processing and curve fitting routes; and, development tools to create graphical user interface that allow operator interaction with test systems
      • The resulting software can control VXIbus and GPIB instruments, as well as analyze and present system data
      • Runs on embedded VXIpc-486 series and VXI-AT2000, VXI-MC2000 MXIbus-based interface kits [...]
    • TestStand
      A ready-to-run test management environment for organizing, controlling, and executing automated prototype, validation, and manufacturing test systems (+)

      Features:

      • Graphical sequence editor environment
      • Adapters for tests written in any programming language
      • Multithreaded sequence execution engine
    • NI Display Test
      Software and hardware solution for inspecting flat panel displays (+)

      Features:

      12275.jpg
      • Prebuilt display test - alignment, pixel defect, color, and contrast
      • Used to test cell phones, PDAs, automobile displays, and other mobile terminals
      • Create new vision tests or integrate other measurement technologies [...]
    • LabVIEW Toolkits
      Two new versions of LabVIEW toolkits for sound and vibration application development (+)

      Features:

      • Simplifies development of many sound and vibration applications, including audio test, noise, vibration and harshness (NVH) test, and machine consition monitoring
      • More than 80 widely used measurement functions
      • Toolkits work with NI dynamic signal acquisition devices, SCXI signal conditioning, FieldPoint, LabVIEW real-time software, and distributed I/O and data acquisition products [...]
    • NI TestStand 4.0
      The new, streamlined sequence editor in NI TestStand 4.0 features preconfigured step templates and drag-and-drop test sequence development (+)

      Features:

      35233.jpg
      • Enhance enterprise system connectivity and reporting by integrating with requirements management, source code control, data management software, and the Automatic Test Markup Language (ATML) [...]
    • DIAdem 9.0
      Interactive software for managing, inspecting, analyzing, and reporting test data (+)

      Features:

      • Imports data from industry-standard databases and file formats such as ASCII, binary, and Excel
      • Handles data sets with more than 1 billion data points
      • Drag-and-drop handling features for accessing test data
    • CVS-1454
      Embedded high-performance processor for increased inspection speed (+)

      Features:

      • 3 FireWire camera inputs
      • Choose the software that works best for your vision applications:
      • Program with NI LabVIEW with Vision Development Module
  • Pacific Avionics Corporation  (1)
    • N/A
      PAC provides fully integrated systems ranging from low cost ARINC 429/629 data acquisition units to comprehensive automated test equipment (+)

      Features:

      • Our systems include portable flight certified units, desktop lab units, and menu-driven go/no-go automated test sets for repair and maintenance facilities
      • Our integrated test systems can support PC, VME, VXI, and MAC platforms [...]
  • Polaris Networks  (3)
    • AMC Tester V1.0.0
      Automated test suite is designed specifically for vendors to test Hardware Platform Management software development for AdvancedMC (+)

      Features:

      • Fully compliant with PICMG specification AMC.0 R2.0.
      • suited to help vendors meet the needs of certification and interoperability
      • The AMC Tester, which complements Polaris' existing range of AdvancedTCA and MicroTCA testers, is now commercially available
    • Automated test suite
      Automated test suite for testing the hardware-management software implementation in MicroTCA-based building blocks or systems (+)

      Features:

      36493.jpg
      • Designed for telecom equipment manufacturers, board-level product manufacturers and system integrators, who wish to reduce the time and resources spent on MicroTCA testing, during the development and regression-testing of building blocks or during system integration
      • Helps meet interoperability and certification requirements of their systems for compliance with the MicroTCA certification suite
      • By checking the compatibility of building-blocks (MCH, chassis FRUs, boards, mezzanine, OEMs) with respect to MicoTCA system management requirements, and by testing all building blocks in an integrated system, independently or simultaneously, the MicroTCA Tester enables you to increase interoperability of building blocks and decrease development and integration time [...]
    • xTCA Test Tools
      Conformance test tools for AdvancedTCA, MicroTCA, and AdvancedMC technologies to assist TEM and system integrators in testing interoperability of building blocks and reduce development and integration time (+)

      Features:

      • Test cases as per PICMG specification requirement
      • The testers have been selected by CP-TA for certification testing
      • Stop or continue on error/warning/info
  • Radical Systems Engineering  (1)
    • High Power Automated Test Stations
      High-power test station with programmable electronic loads (+)

      Features:

      • 13-slot chassis with Pentium controller, embedded oscilloscope, 5 1/2 digit DMM, Form C switch matrix, 32 digital I/O, 8 analog inputs/8 analog outputs, 17-inch monitor, waveform generator, and programmable AC power supplies [...]
  • RF Engines Limited  (1)
    • PCI Upconverter
      A highly configurable, multichannel RF signal generator (+)

      Features:

      • Enables challenging RF environments to be recreated in Test and Measurement Labs
      • 32 channels
      • A complete solution on a Xilinx Virtex-5 FPGA chip that is run within a PC on a PCI Express card
  • SCIDYNE  (1)
    • DIO96-104
      High-density 8-bit, digital I/O module for PC/104 (+)

      Features:

      12617.jpg
      • 96 digital Input/Output channels
      • Uses industry standard 82C55A chips
      • Supports input, output, and strobed operations
  • SKY Computers, Inc.  (1)
    • ATEscope 102
      A high-speed test and diagnostic tool for Automated Test Equipment (ATE) (+)

      Features:

      • Combines ATE and bench instruments, enabling test engineers to perform setups, troubleshooting, and manual testing using the same equipment that performs their automatic testing
      • Switches almost instantaneously between automatic test and manual diagnostic operation
      • Provides digital oscilloscope functions with front panel settings displayed on the PC screen
  • SofTest Designs  (1)
    • N/A
      Provides a complete portfolio of automatic test-related capabilities and products designed to meet automatic test and measurement needs (+)

      Features:

      • Specializes in the development and fabrication of turnkey test systems; provides automatic test solutions in support of production, quality and research & development functional test requirements
      • Specialized system applications have included product inspection and test, prototype design, test and analysis, production test, functional test, and data acquisition
      • Provides VXI-based system solutions employing a variety of software
  • Talon Instruments  (4)
    • Millennia III
      Automated prober extends capabilities of SR192 VXI digital system and Serendipity's FITS digital test software (+)

      Features:

      • Handles CCAs as large as 14 x 14 inches with a probing area of 12 x 14 inches
      • Precise robotic movement can probe points on very dense chips
      • Configured with the hardware and software necessary for VXI system integrators to add to their VXI automated test systems [...]
    • SR192/201-03
      SR192 test fixture [...] (+)

      Features:

    • BE64/201
      Self-test fixture for BE64 (bus emulator module) (+)

      Features:

      • Provides the interconnects to test all signals and incorporates two 8 segment LEDs to report pass/fail data to the user [...]
    • SR192/20
      Support software for the SR192 VXI Digital Module, the SR192 Project Editor/Development Environment was designed to visually define SR192 timing and table setup data, using a 32-bit Windows application which defines digital test data and timing without cumbersome programming (+)

      Features:

      • Digital data patterns and timing cycles are created and viewed via a logic analyzer format
      • Includes heirarchical project view and has external utilities and drivers for interfacing with the SR192
      • A utility for downloading existing data sets and an automatic hardware configuration extractor are also included in the package
  • Teradyne - Assembly Test Division  (15 of 25)
    • TestStation LH
      An in-circuit test system (+)

      Features:

      • PC-based programming and test using Windows XP or NT operating systems
      • Choice of multiplexed or non-multiplexed pin board options
      • High-performance analog instrumentation and 8-channel measurement matrix
    • GDS-3100
      Portable Maintenance Test System (+)

      Features:

      • Standards-based PC support with wired and wireless communications
      • GRADE-XTM Diagnostic Authoring and Runtime Environment
      • Supports a wide range of diagnostic and maintenance applications
    • TestStudio/SP 99
      An open-architecture web-based ATE operating environment for test development, debug, documentation, and execution (+)

      Features:

      3674.jpg
      • Test Program Set (TPS) developers can rehost legacy code written in application development environments like C++, Visual Basic, LabWindows, LabVIEW, and HP VEE, embedded in existing test programs by organizing test activities into steps displayed as nodes on hierarchal project trees
      • Drag-and-drop manipulation of tree "nodes" allow users to visually reorder test steps or reuse test data
      • No matter how many sources there are for test code, TestStudio's sequencing engine executes the final code seamlessly, sharing data between nodes as needed [...]
    • Spectrum 8800-Series
      Board test system built around integrated VXI system architecture for in-circuit and functional board test (+)

      Features:

      • Open-architecture test platform based on VXI, PC, Windows NT, and LabWindows/CVI
      • Allows implementation of single-stage test strategy, performing functional board testing and flash programming, in addition to manufacturing test [...]
    • GR PXIscan Resource Controller
      6U PXI module controls the PXIscan switch cards across a local bus using the CompactPCI P5 connector on GenRad's GPX621 mainframe (+)

      Features:

      • Supports the encoding of test fixtures to ensure that the correct test program matches the test fixture, test system, and the UUT
      • The resource controller relay drivers deliver sufficient current to drive relay coils or other circuitry
      • Works in conjunction with the PXIscan modules to provide module and system-level switching/routing of system signals
    • M9-Series
      Package of C-size digital test instruments for advanced digital and mixed-signal testing (+)

      Features:

      • VXI compliant software driver and hardware for easy integration
      • One central resource board and up to 11 channel cards provide up to 704 bidirectional, programmable-voltage digital test channels in a single 13-slot C-size chassis
      • Accepts additional channel cards to expand pin count
    • GR PXIscan Breadboard Module
      A platform for custom switching and signal conditioning applications for GenRad's GPX621 test mainframe and the GR Versa test system (+)

      Features:

      • Decoding circuitry for the PXIscan subsystem
      • Fused power supplies
      • Detachable prototype area
    • ClearVue 3D X-Ray Test Technology
      Better fault coverage of high density PCB assemblies. (+)

      Features:

      • Fewer false calls.
      • Higher reliability.
      • Ideal for single or double-sided PCB inspection and BGA solder joints where loss of electrical and/or optical test is problematic.
    • ACP Module
      An Automotive Communications Protocol (ACP) module (+)

      Features:

      • Provides multi-protocol, multi-channel support
      • Can be fitted into Teradyne's GR Versa functional test system or integrated with the GPX621 test platform
      • Up to five channels of standard protocols can be operated independently, allowing for individual autonomous testing [...]
    • M910
      VXI digital test subsystem supplies up to 704 bidirectional, variable-voltage, 25 MHz digital test channels in a single VXI-C chassis for high-performance test and diagnostics; fully VXIplug&play compliant; requires no external power or support circuitry [...] (+)

      Features:

    • GRPX1009
      A dual-channel optical attenuator in the CompactPCI form factor (+)

      Features:

      • Delivered as a component of the VersaOT optical test platform to extend its overall test capabilities
      • Validates Rx sensitivity for a product's optical receiver interface, ensuring that it can achieve a certain bit error ratio for a specified minimum value of average received power
      • Each channel provides an FC-style input and output connector accessible via the front panel or J7 instrument panel
    • GPX621
      A high-performance test system mainframe (+)

      Features:

      • 21-slot, 6U PXI/CompactPCI backplane, supports 3U and 6U cards [...]
    • Spectrum 9100 Series
      Test platform for factory and depot environments (+)

      Features:

      • High performance functional test for digital and mixed-signal test requirements
      • Cost effective system configuration and future expansion with modular, standards-based platform design
      • Support for multiple software and TPS development environments in the TestStudio, Web-based operating environment
    • GR Versa
      An integrated PXI/CompactPCI test system (+)

      Features:

      • Includes a GPX621 mainframe with a 21 slot, 6U height, and PXI/CompactPCI backplane that provides the space needed for signal switching and instrumentation within one compact mainframe
      • Tektronix OTS9000 series of optical test instrumentation supports rates up to 10 Gbits/sec and is software selectable between SONET and SDH
      • Alarm generation/detection, optical measurements, and intrusive/non-intrusive through mode capabilities are supported
    • GR Versa AT
      PXI automotive test platform includes the GPX621 chassis, PXIScan switching architecture, and National Instruments' MXI-3 interface that provides a PCI-to-PCI bridge in a single instrument width form factor, providing a transparent interface between any commercial PC and the GPX621 chassis (+)

      Features:

      • Includes the Automotive Communications Protocol module that supports a serial communications interface to the UUT (provides CAN, ISO9141-2, KWP2000, J1850 PWM and VPW protocols)
      • Other protocols may be added by means of plug-in daughterboards
      • Combines National Instruments' multithreaded test engine, TestStand, with GenRad's ENCOMPASS test management software suite, enabling users to manage security, calibration, and the development environment [...]
  • Teseq/Schaffner EMC, Inc.  (4)
    • NSG 4070
      An upgraded test system for conducted and radiated EMC immunity with a new user interface, broader frequency range, enhanced LCD screen and easy-to-use firmware. (+)

      Features:

      • The new NSG 4070's expanded frequency range of 9 kHz to 1 GHz and its modular set-up using either internal or external amplifiers allows it to test a larger variety of applications. This includes testing to industry standards such as IEC 61000-4-6, BCI, IEC 61000-4-3, IEC 61000-4-20 and IEC 61000-4-21.
      • The NSG 4070 is ideal for test labs and design departments, and features a 5-inch x 7-inch LCD screen.
      • . It is equipped with a 9 kHz to 1 GHz integrated signal generator, a 9 kHz to 1 GHz four-channel power meter, and an integrated power amplifier module for different frequency ranges up to 1 GHz and up to 75 W nominal output power
    • Interpro 9000
      A power supply testing system that provides fast, cost-effective life-cycle test management for telecom, industrial, and military-aerospace applications (+)

      Features:

      6710.jpg
      • Provides high throughput through parallel measurement and an optimized state-sensitive test software library
      • IEEE 488 and CANbus provide high-speed command and control across all modules
      • VXI and CompactPCI support are available
    • Compliance 3
      Compliance 3 version 3.90 emission and immunity test software with a USB interface. USB interface support in Compliance 3 (+)

      Features:

      • Allows users to invest in new, lower-cost instruments that do not require a GPIB (general purpose interface bus) card in the controlling PC.
      • The USB interface has several advantages over GPIB. It utilizes smaller, more flexible cables, has fewer cable length restrictions and enables multiple instruments to be easily connected via hubs.
      • Schaffner's Compliance 3 is the leading software for RF EMC testing.
    • ISN System 22
      A test system designed to help users comply with new CISPR 22 standards that require all telecommunications ports on IT equipment be tested for RF emissions in the frequency range of 150 KHz to 30 MHz (+)

      Features:

      8425.jpg
      • Placed on a line, the ISN System 22 measures the emissions coming out of the device, and stabilizes the impedance at 50 ohms
      • Can also be used to perform conductive immunity testing
      • Teseq was formerly known as Schaffner EMC [...]
  • VI Engineering, Inc.  (2)
    • N/A
      VIE can help you design, validate and manufacture your products by providing test, measurement and automation solutions (+)

      Features:

      • If you develop systems internally, our VISTA Consultants can provide productivity tools and training to help streamline your operations
      • Area of Expertise: Acoustics, Analytical Chemistry, ATE/Automated Test Equipment, Calibration, Chromatography, Data Acquisition, Data Analysis, Data Display, Databases, Driver Software, Environmental Monitoring, Expert Systems, Fiber Optics, Image Processing, Industrial Automation, Instrument Control, Invehicle Testing, Manufacturing Execution Systems, Material Science, Motion Control/Robotics, Networking, Optics, PLCs, Power Supplies, Power Monitoring, Product Development, Remote Monitoring, RF/Microwave, Signal Conditioning, Signal Processing, Simulation, SPC, Test and Measurement, Vibration, and Training [...]
    • N/A
      VIE can help you design, validate and manufacture your products by providing test, measurement and automation solutions (+)

      Features:

      • If you develop systems internally, our VISTA Consultants can provide productivity tools and training to help streamline your operations
      • Area of Expertise: Acoustics, Analytical Chemistry, ATE/Automated Test Equipment, Calibration, Chromatography, Data Acquisition, Data Analysis, Data Display, Databases, Driver Software, Environmental Monitoring, Expert Systems, Fiber Optics, Image Processing, Industrial Automation, Instrument Control, Invehicle Testing, Manufacturing Execution Systems, Material Science, Motion Control/Robotics, Networking, Optics, PLCs, Power Supplies, Power Monitoring, Product Development, Remote Monitoring, RF/Microwave, Signal Conditioning, Signal Processing, Simulation, SPC, Test and Measurement, Vibration, and Training [...]
  • Xentech Solutions Ltd  (1)
    • Axtrinet APG208
      Axtrinet APG Ethernet Packet Generators are compact and affordable full wire rate 10Gbps and 40Gbps Ethernet Packet Generator/Analysers with a simple to use Graphical User Interface. Ideally suited to applications in R&D, Test and Manufacturing, the Axtrinet APG Ethernet Packet Generators allow efficient development and testing of: high speed Ethernet network equipment such as switches, routers, firewalls; network monitoring devices; specialist devices such as FPGA accelerator NIC cards and offload appliances; and Ethernet infrastructure installations. (+)

      Features:

      365921716019370481.jpg
      • 10Gbps Ethernet Packet generation and capture
      • 40Gbps Ethernet Packet generation and capture
      • Full wire rate performance on all ports
  • Zhuhai Microsis Electronic Technology Co.,Ltd.  (2)
    • AT15030
      The AT15030 is an integrated MIL-STD-1553A/B bus analyzer, conforming to MIL-STD-1553A/B standard, which could perform the tests defined by the test SPEC of AS4111/3/6 (+)

      Features:

      53328.jpg
      • Script driven test
      • 240Msps, Dual channel, Digital Storage Oscilloscope
      • Customized for the 1553B bus wave acquisition
    • AT15820
      AT15820 is a portable integrated MIL-STD-1553B bus cable tester, which covers the test Specification of SAE AS4115 (+)

      Features:

      53327.jpg
      • Integrated design: Built-in 240Msps Digital Storage Oscilloscope (DSO); Built-in 96Msps Any Waveform Generator (AWG); Built-in multi-function MIL-STD-1553A/B controller
      • Supports 1M/4M bit rate
      • Covers the test Specification of SAE AS 4115